The Si/CdTe semiconductor detector for hard X-ray imager (HXI) onboard ASTRO-H

Kouichi Hagino, Toshio Nakano, Goro Sato, Shin Ichiro Takeda, Hirokazu Odaka, Shin Watanabe, Kazuhiro Nakazawa, Motohide Kokubun, Tadayuki Takahashi

研究成果: Conference contribution査読

抄録

The hard X-ray imager (HXI) is the focal plane detector onboard ASTRO-H to be launched in 2014. By combining with the hard X-ray telescope, the HXI will realize the focusing imaging in the energy range from 5 up to 80 keV. The sensitivity of the HXI for an isolated point source will be two orders of magnitude better compared with previous missions. The hybrid structure composed of four layers of double-sided silicon strip detectors (DSSD) and one layer of cadmium telluride double-sided strip detector (CdTe-DSD) enables high detection efficiency in the hard X-ray band. The DSSD and CdTe-DSD for ASTRO-H have been developed, and their spectral and imaging performances were evaluated. By using two-strip events for the reconstructions of spectra and images, energy resolution of 1.0 keV at 13.9 keV and 2.0 keV at 59.5 keV, and sub-strip spatial resolution were achieved.

本文言語English
ホスト出版物のタイトルHigh Energy Gamma-Ray Astronomy - 5th International Meeting on High Energy Gamma-Ray Astronomy
ページ809-812
ページ数4
DOI
出版ステータスPublished - 1 12 2012
イベント5th International Meeting on High Energy Gamma-Ray Astronomy - Heidelberg, Germany
継続期間: 9 7 201213 7 2012

出版物シリーズ

名前AIP Conference Proceedings
1505
ISSN(印刷版)0094-243X
ISSN(電子版)1551-7616

Conference

Conference5th International Meeting on High Energy Gamma-Ray Astronomy
CountryGermany
CityHeidelberg
Period9/07/1213/07/12

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