Scanning tunneling microscopy of a polygrain Al-Pd-Re quasicrystal: Study of the relative surface stability

R. Tamura, T. P. Yadav, I. M. McLeod, D. Hesp, K. M. Young, T. Nakamura, K. Nishio, V. R. Dhanak, R. McGrath, H. R. Sharma

研究成果: Article査読

5 被引用数 (Scopus)

抄録

Scanning tunneling microscopy and x-ray photoemission spectroscopy on a polygrain icosahedral (i-) Al-Pd-Re quasicrystal (QC) show the formation of the twofold surfaces with symmetry and composition expected from the bulk. The predominant occurrence of the twofold surface on the polygrain i-QC having random grain orientation, as well as preferential formation of terrace edges, kinks and voids along the twofold axes, consistently indicates that the twofold surface, which has the highest atomic density, is the most stable among all the crystallographic planes.

本文言語English
論文番号395007
ジャーナルJournal of Physics Condensed Matter
25
39
DOI
出版ステータスPublished - 2 10月 2013

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