Radiation-Induced Degradation Mechanism of X-Ray SOI Pixel Sensors With Pinned Depleted Diode Structure
Kouichi Hagino, Masatoshi Kitajima, Takayoshi Kohmura, Ikuo Kurachi, Takeshi G. Tsuru, Masataka Yukumoto, Ayaki Takeda, Koji Mori, Yusuke Nishioka, Takaaki Tanaka
研究成果: Article › 査読
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