Improvement of imprinted pattern uniformity using sapphire mold

Y. Tokano, J. Taniguchi, T. Kawasaki, I. Miyamoto, M. Komuro, H. Hiroshima, N. Sakai, K. Tada

研究成果: Conference contribution査読

抄録

Imprint lithography is an attractive technology for LSIs era below 40-nm critical dimension from the viewpoints of high-throughput and low-cost equipment. In order to avoid a pattern placement error due to thermal expansion in the conventional thermal imprint process, we have previously attempted to replicate a mold pattern onto a liquid polymer, which was solidified using ultra-violet (UV) light irradiation at room temperature. The imprint technology based on photo-induced solidification has several advantages such as elimination of heat-up and cool-down time and possibility of step and repeat process. However part of the solidified polymer film was remained on the quartz mold surface. In order to improve this problem, in this article we propose to use a sapphire plate as a mold.

本文言語English
ホスト出版物のタイトル2001 International Microprocesses and Nanotechnology Conference, MNC 2001
出版社Institute of Electrical and Electronics Engineers Inc.
ページ188-189
ページ数2
ISBN(電子版)4891140178, 9784891140175
DOI
出版ステータスPublished - 2001
イベントInternational Microprocesses and Nanotechnology Conference, MNC 2001 - Shimane, Japan
継続期間: 31 10月 20012 11月 2001

出版物シリーズ

名前2001 International Microprocesses and Nanotechnology Conference, MNC 2001

Conference

ConferenceInternational Microprocesses and Nanotechnology Conference, MNC 2001
国/地域Japan
CityShimane
Period31/10/012/11/01

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