TY - JOUR
T1 - Field emission from electron-beam-irradiated bulk diamond
AU - Taniguchi, Jun
AU - Komuro, Masanori
AU - Hiroshima, Hiroshi
AU - Miyamoto, Iwao
PY - 1999/5
Y1 - 1999/5
N2 - In order to extract electrons from bulk diamond, electron-beam (EB) irradiation that controls the surface resistance of synthetic diamond was developed. For slab-shaped bulk diamond which has various surface resistances, the characteristics of the emission current against the cathode voltage were fitted to a Fowler-Nordheim (F-N) plot, which suggests that field emission takes place. Judging from the gradient of the F-N plot before and after EB irradiation, this method produces a low-resistance and low-work function diamond surface. The surface conductive layer formed by electron irradiation contributes electron emission from bulk diamond. Four spot patterns were observed after EB irradiation with a large emission angle of about 45°. Using a bulk diamond stylus, work functions of 0.17 eV were measured from F-N plot gradients. In the case of the diamond stylus, some spots were observed within the emission angle of 17°.
AB - In order to extract electrons from bulk diamond, electron-beam (EB) irradiation that controls the surface resistance of synthetic diamond was developed. For slab-shaped bulk diamond which has various surface resistances, the characteristics of the emission current against the cathode voltage were fitted to a Fowler-Nordheim (F-N) plot, which suggests that field emission takes place. Judging from the gradient of the F-N plot before and after EB irradiation, this method produces a low-resistance and low-work function diamond surface. The surface conductive layer formed by electron irradiation contributes electron emission from bulk diamond. Four spot patterns were observed after EB irradiation with a large emission angle of about 45°. Using a bulk diamond stylus, work functions of 0.17 eV were measured from F-N plot gradients. In the case of the diamond stylus, some spots were observed within the emission angle of 17°.
UR - http://www.scopus.com/inward/record.url?scp=0032625587&partnerID=8YFLogxK
U2 - 10.1016/S0169-4332(99)00035-5
DO - 10.1016/S0169-4332(99)00035-5
M3 - Conference article
AN - SCOPUS:0032625587
SN - 0169-4332
VL - 146
SP - 299
EP - 304
JO - Applied Surface Science
JF - Applied Surface Science
IS - 1
T2 - Proceedings of the 1998 2nd International Vacuum Electron Sources Conference, IVESC-98
Y2 - 7 July 1998 through 10 July 1998
ER -