Evolution of microstructure and defects in sintering of tape-cast alumina laminates observed by synchrotron X-ray multiscale tomography

Gaku Okuma, Ryutaro Usukawa, Toshio Osada, Naoki Kondo, Hideaki Nakajima, Toshiya Okazaki, Shingo Machida, Yutaro Arai, Ryo Inoue, Hideki Kakisawa, Kazuya Shimoda, Akihisa Takeuchi, Masayuki Uesugi, Fumihiro Wakai