Calculation of Degradation Rates of PV Modules Using Outdoor Measured I-V Curves and Multi Reference Linear Interpolation/Extrapolation Method

Yoshiro Izumi, Yuzuru Ueda

研究成果: Conference contribution査読

2 被引用数 (Scopus)

抄録

Outdoor degradation rates (DR) of PV modules for ten years were calculated by means of multi reference linear interpolation/extrapolation method (MRLIM), which utilizes many outdoor measured I-V curve data. Transitions of monthly translated I-V curves under the STC, which are created by MRLIM, indicates how PV module degrades. The DR of maximum power (Pm), short circuit current, open circuit voltage, fill factor, and series resistance were calculated from translated I-V curves. As a result, a poly crystalline Si case, annual DR of Pm was calculated as -0.53 %/year. In addition, the accuracy of this method was calculated by comparing with indoor measurement results.

本文言語English
ホスト出版物のタイトル2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019
出版社Institute of Electrical and Electronics Engineers Inc.
ページ855-860
ページ数6
ISBN(電子版)9781728104942
DOI
出版ステータスPublished - 6月 2019
イベント46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States
継続期間: 16 6月 201921 6月 2019

出版物シリーズ

名前Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN(印刷版)0160-8371

Conference

Conference46th IEEE Photovoltaic Specialists Conference, PVSC 2019
国/地域United States
CityChicago
Period16/06/1921/06/19

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