@inproceedings{414e815f8be84ab8a1d8bf23853f952f,
title = "Time-of-flight measurement as a tool to investigate the hole blocking nature of an operating organic light-emitting diode",
abstract = "For better understanding the operation of organic electronic devices, the information of carrier behavior is indispensable. In this study, we propose a new usage of time-off-light (TOF) technique to examine the carrier behavior in operating device. From the measurement for ITO|α-NPD|Alq3|Al device, which is a widely investigated organic light emitting diode, we have demonstrated the feasibility of TOF measurement for double-layer device in operating condition. The obtained TOF signal includes two kinds of useful information: (i) carrier transporting nature under the influence of actual current flow and (ii) delayed-transport and blocking of carriers at hetero interface.",
keywords = "carrier behavior, hole blocking, organic light emitting diode, time of flight",
author = "Rahman, {Md Mijanur} and Naoki Ogawa and Yutaka Noguchi and Hisao Ishii and Yasuo Nakayama",
year = "2012",
doi = "10.1109/ICIEV.2012.6317499",
language = "English",
isbn = "9781467311519",
series = "2012 International Conference on Informatics, Electronics and Vision, ICIEV 2012",
pages = "342--346",
booktitle = "2012 International Conference on Informatics, Electronics and Vision, ICIEV 2012",
note = "2012 1st International Conference on Informatics, Electronics and Vision, ICIEV 2012 ; Conference date: 18-05-2012 Through 19-05-2012",
}