The effect of citric ion on the spin-sprayed ZnO films: IR and XPS study for the organic impurities

Hajime Wagata, Naoki Ohashi, Ken Ichi Katsumata, Kiyoshi Okada, Nobuhiro Matsushita

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Citations (Scopus)

Abstract

ZnO films with controlled microstructures and crystal orientations were fabricated on nonseeded substrates by a spin-spray method employing tri-sodium citrate as a structure-directing agent at 90°C. The micro structure of the films changed from a rod array to a dense film by addition of the tri-sodium citrate in the solution. The FT-IR spectra of the films prepared with citrate contained organic molecules including carboxyl groups, being attributed to citric ion. Surface analysis by XPS indicated that the adsorbed citric ions were estimated to form zinc-citrate complex including ammonium ion or ammonium citrate.

Original languageEnglish
Title of host publicationElectroceramics in Japan XIV
PublisherTrans Tech Publications Ltd
Pages291-294
Number of pages4
ISBN (Print)9783037851821
DOIs
Publication statusPublished - 2011

Publication series

NameKey Engineering Materials
Volume485
ISSN (Print)1013-9826
ISSN (Electronic)1662-9795

Keywords

  • FT-IR
  • Solution process
  • Spin-spray method
  • XPS
  • ZnO film

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