Pioneering preparation and analysis of a clean surface on a microcrystal, mined by a focused ion beam

Keyphrases

• Clean Surface 100%
• Microcrystals 100%
• Focused Ion Beam 100%
• X-ray Photoelectron Spectroscopy 50%
• Graphite 50%
• Structure Analysis 50%
• Angle-resolved Photoemission Spectroscopy (ARPES) 50%
• Band Dispersion 50%
• Chemical State 50%
• Flakes 50%
• Complex Materials 50%
• Micro-sized 50%
• Proposed Methodology 50%
• Surface Sensitivity 50%
• Electronic Chemicals 50%
• Single Domain Structure 50%
• Microsampling 50%
• Microbeam X-ray 50%
• Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) 50%
• Micrographite 50%

Engineering

• Focused Ion Beam 100%
• Ray Photoelectron Spectroscopy 50%
• Photoemission 50%
• Band Dispersion 50%
• Domain Structure 50%
• Sensitive Surface 50%
• Sized Graphite 50%
• Scanning Electron Microscope 50%