Photoelectron yield spectroscopy for organic materials and interfaces

Hisao Ishii; Hiroumi Kinjo; Tomoya Sato; Shin Ichi Machida; Yasuo Nakayama

doi:10.1007/978-4-431-55206-2_8

Photoelectron yield spectroscopy for organic materials and interfaces

Hisao Ishii, Hiroumi Kinjo, Tomoya Sato, Shin Ichi Machida, Yasuo Nakayama

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

12 Citations (Scopus)

Abstract

Photoelectron yield spectroscopy (PYS), in which total photoelectron yield is recorded as a function of incident photon energy, has been widely applied to determine the ionization energy of various organic electronic materials. PYS has some advantage complimentary to conventional photoelectron spectroscopy; (i) measurement environment is not limited to vacuum, (ii) sample charge-up problem is practically negligible, (iii) high sensitivity is available in vacuum, and so on. Thus, PYS is a powerful method to explore the electronic structures of organic materials and interfaces in practical situation. In this chapter, first we describe the basic principle and experimental setup of PYS. Then the applications to various organic materials and interfaces are described with the results of combined application of PYS and high sensitivity photoemission spectroscopy.

Original language	English
Title of host publication	Electronic Processes in Organic Electronics
Subtitle of host publication	Bridging Nanostructure, Electronic States and Device Properties
Publisher	Springer Japan
Pages	131-155
Number of pages	25
ISBN (Electronic)	9784431552062
ISBN (Print)	9784431552055
DOIs	https://doi.org/10.1007/978-4-431-55206-2_8
Publication status	Published - 1 Jan 2015

Keywords

Charge-up
Electronic structure
Energy level alignment
Environmental measurement
Interfacial electronic structure
Ionization energy
Organic semiconductor
Photoelectron yield spectroscopy

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10.1007/978-4-431-55206-2_8

Cite this

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title = "Photoelectron yield spectroscopy for organic materials and interfaces",

abstract = "Photoelectron yield spectroscopy (PYS), in which total photoelectron yield is recorded as a function of incident photon energy, has been widely applied to determine the ionization energy of various organic electronic materials. PYS has some advantage complimentary to conventional photoelectron spectroscopy; (i) measurement environment is not limited to vacuum, (ii) sample charge-up problem is practically negligible, (iii) high sensitivity is available in vacuum, and so on. Thus, PYS is a powerful method to explore the electronic structures of organic materials and interfaces in practical situation. In this chapter, first we describe the basic principle and experimental setup of PYS. Then the applications to various organic materials and interfaces are described with the results of combined application of PYS and high sensitivity photoemission spectroscopy.",

keywords = "Charge-up, Electronic structure, Energy level alignment, Environmental measurement, Interfacial electronic structure, Ionization energy, Organic semiconductor, Photoelectron yield spectroscopy",

author = "Hisao Ishii and Hiroumi Kinjo and Tomoya Sato and Machida, \{Shin Ichi\} and Yasuo Nakayama",

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T1 - Photoelectron yield spectroscopy for organic materials and interfaces

AU - Ishii, Hisao

AU - Kinjo, Hiroumi

AU - Sato, Tomoya

AU - Machida, Shin Ichi

AU - Nakayama, Yasuo

N1 - Publisher Copyright: © Springer Japan 2015.

PY - 2015/1/1

Y1 - 2015/1/1

N2 - Photoelectron yield spectroscopy (PYS), in which total photoelectron yield is recorded as a function of incident photon energy, has been widely applied to determine the ionization energy of various organic electronic materials. PYS has some advantage complimentary to conventional photoelectron spectroscopy; (i) measurement environment is not limited to vacuum, (ii) sample charge-up problem is practically negligible, (iii) high sensitivity is available in vacuum, and so on. Thus, PYS is a powerful method to explore the electronic structures of organic materials and interfaces in practical situation. In this chapter, first we describe the basic principle and experimental setup of PYS. Then the applications to various organic materials and interfaces are described with the results of combined application of PYS and high sensitivity photoemission spectroscopy.

AB - Photoelectron yield spectroscopy (PYS), in which total photoelectron yield is recorded as a function of incident photon energy, has been widely applied to determine the ionization energy of various organic electronic materials. PYS has some advantage complimentary to conventional photoelectron spectroscopy; (i) measurement environment is not limited to vacuum, (ii) sample charge-up problem is practically negligible, (iii) high sensitivity is available in vacuum, and so on. Thus, PYS is a powerful method to explore the electronic structures of organic materials and interfaces in practical situation. In this chapter, first we describe the basic principle and experimental setup of PYS. Then the applications to various organic materials and interfaces are described with the results of combined application of PYS and high sensitivity photoemission spectroscopy.

KW - Charge-up

KW - Electronic structure

KW - Energy level alignment

KW - Environmental measurement

KW - Interfacial electronic structure

KW - Ionization energy

KW - Organic semiconductor

KW - Photoelectron yield spectroscopy

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SN - 9784431552055

SP - 131

EP - 155

BT - Electronic Processes in Organic Electronics

PB - Springer Japan

ER -

Photoelectron yield spectroscopy for organic materials and interfaces

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Keywords

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