Abstract
The molecular alignment of Langmuir-Blodgett (LB) thin films fabricated on clean and Al-coated glass substrates was investigated by X-ray diffraction, atomic force microscopy, Fourier-transform infrared spectroscopy and electric susceptibility measurements. Ultrathin films of tetra-tert-butyl copper-phthalocyanine (CuttbPc) mixed with promoting stearic acid (SA) were deposited on the substrates by the LB method, forming up to 20 monolayers in a layer-by-layer manner. Molecular alignment was observed to begin beyond about 7 layers. The tilt angle of molecules on the substrates was about 49° and the third-order electric susceptibility of the LB films was measured as Χ(3): Im Χ(3) = -3.86 × 10-7 esu at a wavelength of 620 nm using a z-scan method.
| Original language | English |
|---|---|
| Pages (from-to) | 4312-4315 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 43 |
| Issue number | 7 A |
| DOIs | |
| Publication status | Published - Jul 2004 |
Keywords
- AFM
- FT-IR
- LB
- Molecular formation
- Phthalocyanine
- Third-order susceptibility
- Z-scan method