TY - GEN
T1 - Measurement of characteristic X-rays by positron impact
AU - Nagashima, Yasuyuki
AU - Saito, Fuminori
AU - Itoh, Yoshiko
AU - Goto, Akira
AU - Hyodo, Toshio
N1 - Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2004
Y1 - 2004
N2 - An X-ray detector with thin Si(Li) crystals has been fabricated and employed to detect the characteristic X-rays by positron impact. Use of thin detector crystals is essential for the measurements of the characteristic X-rays induced by positron impact. Otherwise the background produced in the crystals by the annihilation γ-rays is too large to isolate the X-ray peaks. The data has been analyzed to obtain the inner-shell ionization cross sections by positron impact.
AB - An X-ray detector with thin Si(Li) crystals has been fabricated and employed to detect the characteristic X-rays by positron impact. Use of thin detector crystals is essential for the measurements of the characteristic X-rays induced by positron impact. Otherwise the background produced in the crystals by the annihilation γ-rays is too large to isolate the X-ray peaks. The data has been analyzed to obtain the inner-shell ionization cross sections by positron impact.
KW - Characteristic X-Rays
KW - Inner-Shell Ionization Cross-Section
UR - https://www.scopus.com/pages/publications/3042853268
U2 - 10.4028/www.scientific.net/msf.445-446.440
DO - 10.4028/www.scientific.net/msf.445-446.440
M3 - Conference contribution
AN - SCOPUS:3042853268
SN - 9780878499366
T3 - Materials Science Forum
SP - 440
EP - 442
BT - Positron Annihilation
A2 - Hyodo, Toshio
A2 - Saito, Haruo
A2 - Kobayashi, Yoshinori
A2 - Nagashima, Yasuyuki
PB - Trans Tech Publications Ltd
T2 - Positron Annihilation: Proceedings of the 13th International Conference on Positron Annihilation, ICPA-13
Y2 - 7 September 2003 through 12 September 2003
ER -