Insight into the Mechanism of Tail Bits in Data Retention of Vacancy-Modulated Conductive Oxide RRAM

Sang Gyu Koh, Kazuaki Kurihara, Attilio Belmonte, Mihaela Ioana Popovici, Gabriele Luca Donadio, Ludovic Goux, Gouri Sankar Kar

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

The underlying mechanism causing tail bits in data retention for high resistance state (HRS) of vacancy-modulated conductive oxide resistive RAM, consisting of TiN/amorphous-Si/TiO2/TiN structure, was investigated. The tail bits observed in the small size cells with large On/Off ratio were attributed to the current fluctuations in time. The mechanism, in which the current fluctuation is caused by the fragility of the conduction path in a high resistive region determining the cell current in TiO2, was clarified by retention measurement with various conditions of On/Off ratio and cell size. It was found that the total number of defects in the high resistive region is the key to ensure a steady HRS conduction. We, furthermore, demonstrated a way to suppress the tail bits in the small size cells nm2) even with large On/Off ratio by process tuning of TiO2 film fabrication.

Original languageEnglish
Pages (from-to)480-483
Number of pages4
JournalIEEE Electron Device Letters
Volume39
Issue number4
DOIs
Publication statusPublished - Apr 2018

Keywords

  • RRAM
  • TiO
  • data retention
  • non-filamentary resistive switching
  • tail bits

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