Imaging Method using Multi-Threshold Pattern for Photon Detection of Quanta Image Sensor

Shuichi Namiki, Shunichi Sato, Yusuke Kameda, Takayuki Hamamoto

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


In recent years, the development of the Quanta Image Sensor (QIS), which can observe the amount of incident light intensity in units of photons, has been progressing. In QIS imaging, a large number of photon incident observations are performed in the spatio-temporal direction, and multi-valued images are obtained by reconstruction processing. The observation process outputs a binary value that indicates whether the number of incident photons exceeds a preset threshold number in the minute photon detector (jot). In many existing methods for QIS imaging, a uniform threshold is set for all jots, causing the reconstructed multi-valued image to be overexposed or underexposed. On the other hand, setting an optimal threshold for each local region individually requires time for adjustment, which leads to a decrease in temporal resolution. In this paper, we propose an imaging method that accurately captures a wide range of light intensity by introducing a periodic pattern consisting of multiple thresholds. Since we do not adjust the threshold for each scene individually, we can fundamentally avoid the degradation of temporal resolution. In addition, since the threshold has a variety of values when applied to jots, it is possible to obtain a high-quality multi-valued image even with a small number of photon incident observations. Our proposed method consists of three components that take the characteristics of photon incident observation into account: statistical light intensity estimation, noise reduction, and optimization of the periodic pattern.

Original languageEnglish
Title of host publicationInternational Workshop on Advanced Imaging Technology, IWAIT 2022
EditorsMasayuki Nakajima, Shogo Muramatsu, Jae-Gon Kim, Jing-Ming Guo, Qian Kemao
ISBN (Electronic)9781510653313
Publication statusPublished - 2022
Event2022 International Workshop on Advanced Imaging Technology, IWAIT 2022 - Hong Kong, China
Duration: 4 Jan 20226 Jan 2022

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


Conference2022 International Workshop on Advanced Imaging Technology, IWAIT 2022
CityHong Kong


  • image reconstruction
  • multi threshold pattern
  • quanta image sensor
  • single-photon imaging


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