TY - GEN
T1 - Imaging Method using Multi-Threshold Pattern for Photon Detection of Quanta Image Sensor
AU - Namiki, Shuichi
AU - Sato, Shunichi
AU - Kameda, Yusuke
AU - Hamamoto, Takayuki
N1 - Funding Information:
This work was supported by the Japan Society for the Promotion of Science KAKENHI under Grant JP19K12025.
Publisher Copyright:
© 2022 SPIE.
PY - 2022
Y1 - 2022
N2 - In recent years, the development of the Quanta Image Sensor (QIS), which can observe the amount of incident light intensity in units of photons, has been progressing. In QIS imaging, a large number of photon incident observations are performed in the spatio-temporal direction, and multi-valued images are obtained by reconstruction processing. The observation process outputs a binary value that indicates whether the number of incident photons exceeds a preset threshold number in the minute photon detector (jot). In many existing methods for QIS imaging, a uniform threshold is set for all jots, causing the reconstructed multi-valued image to be overexposed or underexposed. On the other hand, setting an optimal threshold for each local region individually requires time for adjustment, which leads to a decrease in temporal resolution. In this paper, we propose an imaging method that accurately captures a wide range of light intensity by introducing a periodic pattern consisting of multiple thresholds. Since we do not adjust the threshold for each scene individually, we can fundamentally avoid the degradation of temporal resolution. In addition, since the threshold has a variety of values when applied to jots, it is possible to obtain a high-quality multi-valued image even with a small number of photon incident observations. Our proposed method consists of three components that take the characteristics of photon incident observation into account: statistical light intensity estimation, noise reduction, and optimization of the periodic pattern.
AB - In recent years, the development of the Quanta Image Sensor (QIS), which can observe the amount of incident light intensity in units of photons, has been progressing. In QIS imaging, a large number of photon incident observations are performed in the spatio-temporal direction, and multi-valued images are obtained by reconstruction processing. The observation process outputs a binary value that indicates whether the number of incident photons exceeds a preset threshold number in the minute photon detector (jot). In many existing methods for QIS imaging, a uniform threshold is set for all jots, causing the reconstructed multi-valued image to be overexposed or underexposed. On the other hand, setting an optimal threshold for each local region individually requires time for adjustment, which leads to a decrease in temporal resolution. In this paper, we propose an imaging method that accurately captures a wide range of light intensity by introducing a periodic pattern consisting of multiple thresholds. Since we do not adjust the threshold for each scene individually, we can fundamentally avoid the degradation of temporal resolution. In addition, since the threshold has a variety of values when applied to jots, it is possible to obtain a high-quality multi-valued image even with a small number of photon incident observations. Our proposed method consists of three components that take the characteristics of photon incident observation into account: statistical light intensity estimation, noise reduction, and optimization of the periodic pattern.
KW - image reconstruction
KW - multi threshold pattern
KW - quanta image sensor
KW - single-photon imaging
UR - http://www.scopus.com/inward/record.url?scp=85131796245&partnerID=8YFLogxK
U2 - 10.1117/12.2625974
DO - 10.1117/12.2625974
M3 - Conference contribution
AN - SCOPUS:85131796245
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - International Workshop on Advanced Imaging Technology, IWAIT 2022
A2 - Nakajima, Masayuki
A2 - Muramatsu, Shogo
A2 - Kim, Jae-Gon
A2 - Guo, Jing-Ming
A2 - Kemao, Qian
PB - SPIE
T2 - 2022 International Workshop on Advanced Imaging Technology, IWAIT 2022
Y2 - 4 January 2022 through 6 January 2022
ER -