I-V Curve Differences Image Classification by CNN for Failure Factor Determination in PV system

Shunya Hasegawa, Yuzuru Ueda

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

With a widespread of photovoltaic (PV) systems, a long-term use of the systems is expected. Since the amount of power generation can be decreased due to failures by various causes in the system, a practical way to detect the cause of the failure is needed for long-term uses of the system. This paper proposes a method to determine the cause of the failure in the PV system using convolutional neural network (CNN) by classifying the image of measured I-V curves which might have some failures. As a result, a case of the I-V curves which were caused by a stepped defect in a string unit was detected 100% correctly.

Original languageEnglish
Title of host publication2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages683-688
Number of pages6
ISBN (Electronic)9781728161150
DOIs
Publication statusPublished - 14 Jun 2020
Event47th IEEE Photovoltaic Specialists Conference, PVSC 2020 - Calgary, Canada
Duration: 15 Jun 202021 Aug 2020

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
Volume2020-June
ISSN (Print)0160-8371

Conference

Conference47th IEEE Photovoltaic Specialists Conference, PVSC 2020
Country/TerritoryCanada
CityCalgary
Period15/06/2021/08/20

Keywords

  • CNN
  • I-V curve
  • PV system
  • failure determination

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