Evolution of microstructure and defects in sintering of tape-cast alumina laminates observed by synchrotron X-ray multiscale tomography

Processing-induced defects affect the performance and reliability of multilayered ceramics. They are introduced from the raw powder, or during tape casting, drying, thermo-compression, binder burnout, and sintering. Using synchrotron X-ray multiscale tomography, we investigated how the microstructural heterogeneities and various defects evolve in the sintering of tape-cast alumina laminate. The strength-limiting defects were identified as large defects at the layer interface and peculiar crack-like defects formed around large inclusions contained in the raw powder. Although a slurry might be uniform in colloidal processing, the particle packing in the tape was heterogeneous. This heterogeneity determined the spatial distribution of pores and formed complex pores in later stages. Moreover, we found the formation of flake-like sheets in slurry due to the self-assembly of polyhedral alumina crystals. This phenomenon has the potential to be applied in the manufacture of 2D micro-sheets controlled to the thickness of a single particle.