Effect of annealing temperature on Eu2+ and Eu3+ ratios in AlN:Eu thin films

Kazuto Miyano, Yingda Qian, Asuka Ishizawa, Shinichiro Kaku, Xinwei Zhao, Mariko Murayama

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

Eu-doped aluminum nitride (AlN:Eu) thin films were fabricated and characterized in a way of white light generation. AlN exhibits blue luminescence originating from defect levels. Furthermore, Eu2+ demonstrates green luminescence, while Eu3+ emits red light. Consequently, white luminescence is anticipated in Eu-doped AIN thin films. The concept is to control the ratio of Eu2+/Eu3+ in the thin film to vary the emission colors. We aimed to manipulate the Eu valence ratio in AIN:Eu thin films by changing the annealing temperature and examining the resultant luminescence characteristics. Our findings revealed an increase in defect-related luminescence in AIN samples annealed at higher temperatures, along with a rise in the Eu2+ fraction. We explore these outcomes in relation to the structural models surrounding Al and Eu ions, as elaborated in the main text.

Original languageEnglish
Article number03SP34
JournalJapanese Journal of Applied Physics
Volume63
Issue number3
DOIs
Publication statusPublished - 1 Mar 2024

Keywords

  • AlN
  • LED
  • photoluminescence
  • PLD
  • rare-earth
  • wide bandgap semiconductor

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