Development of Au/Pt/Ti multilayers for wafer-level packaging and residual gas gettering

S. Kariya, T. Matsumae, Y. Kurashima, H. Takagi, M. Hayase, E. Higurashi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

We demonstrated that Au/Pt/Ti (from top to bottom) metal multilayers enables wafer-level packaging of degassed assemblies and residual gas gettering. A hermetic sealing was fabricated by Au surfaces after degassing annealing at 200°C. In addition, the Ti underlayer atoms diffused to the internal surface by annealing at 450°C, enabling the gas in the package. As the Au/Pt/Ti layers have the functions of the bonding layer and gas getter, the proposed packaging technique can potentially simplify a vacuum sealing process.

Original languageEnglish
Title of host publication2021 International Conference on Electronics Packaging, ICEP 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages69-70
Number of pages2
ISBN (Electronic)9784991191114
DOIs
Publication statusPublished - 12 May 2021
Event20th International Conference on Electronics Packaging, ICEP 2021 - Tokyo, Japan
Duration: 12 May 202114 May 2021

Publication series

Name2021 International Conference on Electronics Packaging, ICEP 2021

Conference

Conference20th International Conference on Electronics Packaging, ICEP 2021
Country/TerritoryJapan
CityTokyo
Period12/05/2114/05/21

Keywords

  • Degas annealing
  • Direct bonding
  • Gettering of residual gas
  • MEMS
  • vacuum packaging

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