TY - JOUR
T1 - Crystallinity of the epitaxial heterojunction of C60 on single crystal pentacene
AU - Tsuruta, Ryohei
AU - Mizuno, Yuta
AU - Hosokai, Takuya
AU - Koganezawa, Tomoyuki
AU - Ishii, Hisao
AU - Nakayama, Yasuo
N1 - Publisher Copyright:
© 2016 Elsevier B.V.
PY - 2017/6/15
Y1 - 2017/6/15
N2 - The structure of pn heterojunctions is an important subject in the field of organic semiconductor devices. In this work, the crystallinity of an epitaxial pn heterojunction of C60 on single crystal pentacene is investigated by non-contact mode atomic force microscopy and high-resolution grazing incidence x-ray diffraction. Analysis shows that the C60 molecules assemble into grains consisting of single crystallites on the pentacene single crystal surface. The in-plane mean crystallite size exceeds 0.1 µm, which is at least five time larger than the size of crystallites deposited onto polycrystalline pentacene thin films grown on SiO2. The results indicate that improvement in the crystal quality of the underlying molecular substrate leads to drastic promotion of the crystallinity at the organic semiconductor heterojunction.
AB - The structure of pn heterojunctions is an important subject in the field of organic semiconductor devices. In this work, the crystallinity of an epitaxial pn heterojunction of C60 on single crystal pentacene is investigated by non-contact mode atomic force microscopy and high-resolution grazing incidence x-ray diffraction. Analysis shows that the C60 molecules assemble into grains consisting of single crystallites on the pentacene single crystal surface. The in-plane mean crystallite size exceeds 0.1 µm, which is at least five time larger than the size of crystallites deposited onto polycrystalline pentacene thin films grown on SiO2. The results indicate that improvement in the crystal quality of the underlying molecular substrate leads to drastic promotion of the crystallinity at the organic semiconductor heterojunction.
KW - A3. Molecular beam epitaxy
KW - B1. Organic compounds
KW - Grazing incident x-ray diffraction
KW - Organic semiconductor
KW - pn-Heterojunction, synchrotron radiation
UR - http://www.scopus.com/inward/record.url?scp=85006039962&partnerID=8YFLogxK
U2 - 10.1016/j.jcrysgro.2016.10.031
DO - 10.1016/j.jcrysgro.2016.10.031
M3 - Article
AN - SCOPUS:85006039962
SN - 0022-0248
VL - 468
SP - 770
EP - 773
JO - Journal of Crystal Growth
JF - Journal of Crystal Growth
ER -