Crystal structure change with applied electric field for (100)/(001)-oriented polycrystalline lead zirconate titanate films

Ayumi Wada; Yoshitaka Ehara; Shintaro Yasui; Takahiro Oikawa; Mitsumasa Nakajima; Megu Wada; P. S.Sankara Rama Krishnan; Soichiro Okamura; Ken Nishida; Takashi Yamamoto; Takeshi Kobayashi; Hitoshi Morioka; Hiroshi Funakubo

doi:10.1557/opl.2013.161

Crystal structure change with applied electric field for (100)/(001)-oriented polycrystalline lead zirconate titanate films

Ayumi Wada, Yoshitaka Ehara, Shintaro Yasui, Takahiro Oikawa, Mitsumasa Nakajima, Megu Wada, P. S.Sankara Rama Krishnan, Soichiro Okamura, Ken Nishida, Takashi Yamamoto, Takeshi Kobayashi, Hitoshi Morioka, Hiroshi Funakubo

Department of Applied Physics

Research output: Contribution to journal › Conference article › peer-review

3 Citations (Scopus)

Abstract

Crystal structure change with an applied electric field was investigated by Raman spectroscopy and X-ray diffraction (XRD) for the 1 μm-thick (100)/(001) one-axis oriented tetragonal Pb(Zr_0.3Ti _0.7)O₃ films prepared on Pt-covered (100) Si substrates by chemical solution deposition technique. As-deposited films were under the strained condition in good agreement with the estimation from the thermal strain applied under the cooling process after the deposition from the Curie temperature to the room temperature. This strain was ascertained to be relaxed by an applied electric field in accompanying with the dramatic increase of the volume fraction of (001) orientation. These results demonstrate the importance of the crystal structure measurement not only as-deposited films, but also after applied electric field, such as after poling.

Original language	English
Journal	Materials Research Society Symposium Proceedings
Volume	1507
DOIs	https://doi.org/10.1557/opl.2013.161
Publication status	Published - 2013
Event	2012 MRS Fall Meeting - Boston, MA, United States Duration: 25 Nov 2012 → 30 Nov 2012

Keywords

Raman spectroscopy
sol-gel
x-ray diffraction (XRD)

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10.1557/opl.2013.161

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Wada, A., Ehara, Y., Yasui, S., Oikawa, T., Nakajima, M., Wada, M., Krishnan, P. S. S. R., Okamura, S., Nishida, K., Yamamoto, T., Kobayashi, T., Morioka, H., & Funakubo, H. (2013). Crystal structure change with applied electric field for (100)/(001)-oriented polycrystalline lead zirconate titanate films. Materials Research Society Symposium Proceedings, 1507. https://doi.org/10.1557/opl.2013.161

@article{f084c18754d1404f95eb85a2219c1ae6,

title = "Crystal structure change with applied electric field for (100)/(001)-oriented polycrystalline lead zirconate titanate films",

abstract = "Crystal structure change with an applied electric field was investigated by Raman spectroscopy and X-ray diffraction (XRD) for the 1 μm-thick (100)/(001) one-axis oriented tetragonal Pb(Zr0.3Ti 0.7)O3 films prepared on Pt-covered (100) Si substrates by chemical solution deposition technique. As-deposited films were under the strained condition in good agreement with the estimation from the thermal strain applied under the cooling process after the deposition from the Curie temperature to the room temperature. This strain was ascertained to be relaxed by an applied electric field in accompanying with the dramatic increase of the volume fraction of (001) orientation. These results demonstrate the importance of the crystal structure measurement not only as-deposited films, but also after applied electric field, such as after poling.",

keywords = "Raman spectroscopy, sol-gel, x-ray diffraction (XRD)",

author = "Ayumi Wada and Yoshitaka Ehara and Shintaro Yasui and Takahiro Oikawa and Mitsumasa Nakajima and Megu Wada and Krishnan, {P. S.Sankara Rama} and Soichiro Okamura and Ken Nishida and Takashi Yamamoto and Takeshi Kobayashi and Hitoshi Morioka and Hiroshi Funakubo",

year = "2013",

doi = "10.1557/opl.2013.161",

language = "English",

volume = "1507",

journal = "Materials Research Society Symposium Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

note = "2012 MRS Fall Meeting ; Conference date: 25-11-2012 Through 30-11-2012",

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Wada, A, Ehara, Y, Yasui, S, Oikawa, T, Nakajima, M, Wada, M, Krishnan, PSSR, Okamura, S, Nishida, K, Yamamoto, T, Kobayashi, T, Morioka, H & Funakubo, H 2013, 'Crystal structure change with applied electric field for (100)/(001)-oriented polycrystalline lead zirconate titanate films', Materials Research Society Symposium Proceedings, vol. 1507. https://doi.org/10.1557/opl.2013.161

TY - JOUR

T1 - Crystal structure change with applied electric field for (100)/(001)-oriented polycrystalline lead zirconate titanate films

AU - Wada, Ayumi

AU - Ehara, Yoshitaka

AU - Yasui, Shintaro

AU - Oikawa, Takahiro

AU - Nakajima, Mitsumasa

AU - Wada, Megu

AU - Krishnan, P. S.Sankara Rama

AU - Okamura, Soichiro

AU - Nishida, Ken

AU - Yamamoto, Takashi

AU - Kobayashi, Takeshi

AU - Morioka, Hitoshi

AU - Funakubo, Hiroshi

PY - 2013

Y1 - 2013

N2 - Crystal structure change with an applied electric field was investigated by Raman spectroscopy and X-ray diffraction (XRD) for the 1 μm-thick (100)/(001) one-axis oriented tetragonal Pb(Zr0.3Ti 0.7)O3 films prepared on Pt-covered (100) Si substrates by chemical solution deposition technique. As-deposited films were under the strained condition in good agreement with the estimation from the thermal strain applied under the cooling process after the deposition from the Curie temperature to the room temperature. This strain was ascertained to be relaxed by an applied electric field in accompanying with the dramatic increase of the volume fraction of (001) orientation. These results demonstrate the importance of the crystal structure measurement not only as-deposited films, but also after applied electric field, such as after poling.

AB - Crystal structure change with an applied electric field was investigated by Raman spectroscopy and X-ray diffraction (XRD) for the 1 μm-thick (100)/(001) one-axis oriented tetragonal Pb(Zr0.3Ti 0.7)O3 films prepared on Pt-covered (100) Si substrates by chemical solution deposition technique. As-deposited films were under the strained condition in good agreement with the estimation from the thermal strain applied under the cooling process after the deposition from the Curie temperature to the room temperature. This strain was ascertained to be relaxed by an applied electric field in accompanying with the dramatic increase of the volume fraction of (001) orientation. These results demonstrate the importance of the crystal structure measurement not only as-deposited films, but also after applied electric field, such as after poling.

KW - Raman spectroscopy

KW - sol-gel

KW - x-ray diffraction (XRD)

UR - http://www.scopus.com/inward/record.url?scp=84897984163&partnerID=8YFLogxK

U2 - 10.1557/opl.2013.161

DO - 10.1557/opl.2013.161

M3 - Conference article

AN - SCOPUS:84897984163

SN - 0272-9172

VL - 1507

JO - Materials Research Society Symposium Proceedings

JF - Materials Research Society Symposium Proceedings

T2 - 2012 MRS Fall Meeting

Y2 - 25 November 2012 through 30 November 2012

ER -

Crystal structure change with applied electric field for (100)/(001)-oriented polycrystalline lead zirconate titanate films

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Keywords

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