Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement

Takumi Hosaka, Shinichi Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, simple and compact Negative Bias Temperature Instability (NBTI) model is proposed. The model is based on the reaction-diffusion (tn) and hole-trapping (log(t)) theories. A single shot of DC stress and recovery data is utilized to express duty cycle dependence of NBTI degradation and recovery. Parameter fitting is proceeded by considering that the amount of recovery cannot be larger than stress degradation. The proposed model successfully replicates stress and recovery with various duty cycles.

Original languageEnglish
Title of host publication2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
EditorsDimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages305-309
Number of pages5
ISBN (Electronic)9781728124902
DOIs
Publication statusPublished - Jul 2019
Event25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 - Rhodes, Greece
Duration: 1 Jul 20193 Jul 2019

Publication series

Name2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019

Conference

Conference25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
CountryGreece
CityRhodes
Period1/07/193/07/19

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Keywords

  • AC stress dependency
  • Negative bias temperature instability (NBTI)
  • hole trapping
  • reaction diffusion

Cite this

Hosaka, T., Nishizawa, S., Kishida, R., Matsumoto, T., & Kobayashi, K. (2019). Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement. In D. Gizopoulos, D. Alexandrescu, P. Papavramidou, & M. Maniatakos (Eds.), 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 (pp. 305-309). [8854421] (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IOLTS.2019.8854421