Abstract
A SiO2-TiO2 gel containing 10 mol.% TiO2 was prepared with the mixed solution of Si(OC2H5)4 and Ti[O(CH2)3CH3]4. The Ti-EXAFS (Extended X-ray Absorption Fine Structure) above its K-adsorption edge was measured for the gel treated at elevated temperatures up to 800°C. The estimated TiO distance indicated that Ti4+ ions were initially introduced into four-coordinated sites in the gel structure and then, the TiO distance betwme longer by the further pyrolysis above 400°C.
Original language | English |
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Pages (from-to) | 97-102 |
Number of pages | 6 |
Journal | Journal of Non-Crystalline Solids |
Volume | 82 |
Issue number | 1-3 |
DOIs | |
Publication status | Published - 1 Jun 1986 |