Abstract
Distinguishing photon arrival time and position is crucial for advancing quantum technology. However, capturing spatial and temporal information efficiently remains challenging. Here, we present a novel photon detection technique to achieve a significantly more efficient measurement of frequency-entangled biphoton than conventional photon detectors. We utilize a delay-line-anode single-photon detector (DLD), which consists of a position-sensitive delay-line anode sensor behind a microchannel plate. Biphotons are obtained from the decay of biexcitons in the copper chloride semiconductor crystal. Two DLDs are coupled with a grating spectrometer exit to measure the joint spectral distributions of the biphoton. The resulting non-scanning process requires only a few minutes to obtain a temporally and spectrally resolved image, much quicker than the scanning biphoton frequency measurements such as monochromator or Fourier spectroscopy. Our technique paves the way for all experiments in multi-mode quantum science requiring coincidence measurement.
Original language | English |
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Pages (from-to) | 19504-19513 |
Number of pages | 10 |
Journal | Optics Express |
Volume | 33 |
Issue number | 9 |
DOIs | |
Publication status | Published - 5 May 2025 |