In order to analyze the electric field disturbance due to the sensor probe, a new effective BEM is developed. In this method, the analysis is divided into three stages and the size of matrix to be solved is reduced. A new line-shaped element is developed and the boundary integrals for far area are also approximated. Two example problems are solved. It is found that the result obtained by this method agrees well with the conventional method and the computation time was reduced 1/15. It is also found that the SVET overestimates the electric field due to the sensor probe.
|Number of pages||8|
|Publication status||Published - 1 Jan 1996|
|Event||Proceedings of the 1996 4th International Conference on Computer-Aided Assessment and Control - Fukuoka, Jpn|
Duration: 3 Jun 1996 → 5 Jun 1996
|Conference||Proceedings of the 1996 4th International Conference on Computer-Aided Assessment and Control|
|Period||3/06/96 → 5/06/96|