An lsi system with locked in temperature insensitive state achieved by using body bias technique

Goichi Ono, Masayuki Miyazaki, Kazuki Watanabe, Takayuki Kawahara

Research output: Contribution to journalConference article

6 Citations (Scopus)

Abstract

Forward-body-bias (FBB) technology can compensate performance fluctuation in LSIs for low-voltageoperation. However, because the FBB characteristics depend on the temperature, the FBB control effect is decreased at high temperatures. A temperature insensitive state (TIS) for supply voltage improves the LSI performance as a solution of the dependence of the FBB characteristics on temperature. When an LSI is operated in a TIS, the performance fluctuation is fixed in a low temperature condition. We propose a TIS locking circuit that achieves TIS operation and reduces performance fluctuation. The circuit achieves this by detecting threshold voltage and generating voltage proportional to temperature. Compensating TIS decreased performance fluctuation and power consumption to one-third that of an LSI before TIS control was applied.

Original languageEnglish
Article number1464667
Pages (from-to)632-635
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
DOIs
Publication statusPublished - 1 Dec 2005
EventIEEE International Symposium on Circuits and Systems 2005, ISCAS 2005 - Kobe, Japan
Duration: 23 May 200526 May 2005

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