An Extended Kirchhoff–Love Shell Model with Out-of-Plane Normal Stress: Out-of-Plane Deformation

Yasutoshi Taniguchi, Kenji Takizawa, Yuto Otoguro, Tayfun E. Tezduyar

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

3 Citations (Scopus)

Abstract

In this chapter on a hyperelastic extended Kirchhoff–Love shell model with out-of-plane normal stress, we present the derivation of the new model, with focus on the mechanics of the out-of-plane deformation. Accounting for the out-of-plane normal stress distribution in the out-of-plane direction affects the accuracy in calculating the deformed-configuration out-of-plane position, and consequently the nonlinear response of the shell. The improvement is beyond what we get from accounting for the out-of-plane deformation mapping. By accounting for the out-of-plane normal stress, the traction acting on the shell can be specified on the upper and lower surfaces separately. With that, the new model is free from the “midsurface” location in terms of specifying the traction. We also present derivations related to the variation of the kinetic energy and the form of specifying the traction and moment acting on the upper and lower surfaces and along the edges. We present test computations for unidirectional plate bending. We use the neo-Hookean and Fung’s material models, for the compressible- and incompressible-material cases, and with the out-of-plane normal stress and without, which is the plane-stress case.

Original languageEnglish
Title of host publicationModeling and Simulation in Science, Engineering and Technology
PublisherBirkhauser
Pages389-435
Number of pages47
DOIs
Publication statusPublished - 2023

Publication series

NameModeling and Simulation in Science, Engineering and Technology
VolumePart F1665
ISSN (Print)2164-3679
ISSN (Electronic)2164-3725

Fingerprint

Dive into the research topics of 'An Extended Kirchhoff–Love Shell Model with Out-of-Plane Normal Stress: Out-of-Plane Deformation'. Together they form a unique fingerprint.

Cite this