TY - JOUR
T1 - Accurate phase analysis of interferometric fringes by the spatiotemporal phase-shifting method
AU - Ri, Shien
AU - Takimoto, Taiki
AU - Xia, Peng
AU - Wang, Qinghua
AU - Tsuda, Hiroshi
AU - Ogihara, Shinji
N1 - Funding Information:
Original content from this work may be used under the terms of the . Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. Grants-in-Aid for Scientific Research (KAKENHI) from the Japan Society for the Promotion of Science Grant 20H02038 yes � 2020 IOP Publishing Ltd Creative Commons Attribution 4.0 license
Publisher Copyright:
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PY - 2020/10
Y1 - 2020/10
N2 - Phase-shifting interferometry (PSI) has been widely applied in the field of accurate optical methodology. However, the fluctuation of background and amplitude intensities due to the instability of laser source, and phase-shifting error or vibration are significant problems for the PSI. In this study, the spatiotemporal phase-shifting method (ST-PSM) (Ri S et al 2019 J. Opt. 21 095702), which is a highly accurate and robust phase analysis method using spatial and temporal intensities information simultaneously, is first applied to laser interferometry to achieve a stable measurement. Through several simulations, three effects of fluctuations in background and amplitude intensities, phase-shifting error were investigated. As a result, we clarified that the periodic phase error with fundamental or second harmonic frequencies occurs in the conventional PSM method, whereas no periodic error occurs in the ST-PSM. Besides, the ST-PSM is also robust to the noise either for uniform or distorted interference fringe images. In the Michelson laser interferometer experiment, the ST-PSM realizes a much more stable measurement of phase and phase gradient distributions than the PSM. We have revealed the excellent performance and the striking advantage that ST-PSM is entirely free of periodic errors in a similar manner to the simulations. Therefore, laser interferometry using the ST-PSM can be expected to apply to various applications, including the extremely accurate non-contact shape and deformation measurement, as well as thickness measurement of transparent materials in life and material sciences.
AB - Phase-shifting interferometry (PSI) has been widely applied in the field of accurate optical methodology. However, the fluctuation of background and amplitude intensities due to the instability of laser source, and phase-shifting error or vibration are significant problems for the PSI. In this study, the spatiotemporal phase-shifting method (ST-PSM) (Ri S et al 2019 J. Opt. 21 095702), which is a highly accurate and robust phase analysis method using spatial and temporal intensities information simultaneously, is first applied to laser interferometry to achieve a stable measurement. Through several simulations, three effects of fluctuations in background and amplitude intensities, phase-shifting error were investigated. As a result, we clarified that the periodic phase error with fundamental or second harmonic frequencies occurs in the conventional PSM method, whereas no periodic error occurs in the ST-PSM. Besides, the ST-PSM is also robust to the noise either for uniform or distorted interference fringe images. In the Michelson laser interferometer experiment, the ST-PSM realizes a much more stable measurement of phase and phase gradient distributions than the PSM. We have revealed the excellent performance and the striking advantage that ST-PSM is entirely free of periodic errors in a similar manner to the simulations. Therefore, laser interferometry using the ST-PSM can be expected to apply to various applications, including the extremely accurate non-contact shape and deformation measurement, as well as thickness measurement of transparent materials in life and material sciences.
KW - Fringe analysis
KW - Laser interferometry
KW - Optical metrology
KW - Phase measurement
KW - Phase-shifting error
UR - http://www.scopus.com/inward/record.url?scp=85094980713&partnerID=8YFLogxK
U2 - 10.1088/2040-8986/abb1d1
DO - 10.1088/2040-8986/abb1d1
M3 - Article
AN - SCOPUS:85094980713
VL - 22
JO - Journal of Optics
JF - Journal of Optics
SN - 2040-8978
IS - 10
M1 - 105703
ER -